Items Covered
- a.Equipment "specially designed" for the inspection or testing of electron tubes, optical elements and "specially designed" "parts" and "components" therefor controlled by 3A001 or 3A991;
- b.Equipment "specially designed" for the inspection or testing of semiconductor devices, integrated circuits and "electronic assemblies", as follows, and systems incorporating or having the characteristics of such equipment:
- 1. "Stored program controlled" inspection equipment for the automatic detection of defects, errors or contaminants of 0.6 micrometer or less in or on processed wafers, "substrates", other than printed circuit boards or chips, using optical image acquisition techniques for pattern comparison;
- 2. "specially designed" "stored program controlled" measuring and analysis equipment, as follows:
- 2.a. "specially designed" for the measurement of oxygen (O) or carbon (C) content in semiconductor materials;
- 2.b. Equipment for line width measurement with a resolution of 1 micrometer or finer;
- 2.c. "specially designed" flatness measurement instruments capable of measuring deviations from flatness of 10 micrometer or less with a resolution of 1 micrometer or finer.
- 3. "Stored program controlled" wafer probing equipment having any of the following characteristics:
- 3.a. Positioning accuracy finer than 3.5 micrometer;
- 3.b. Capable of testing devices having more than 68 terminals; or
- 3.c. Capable of testing at a frequency exceeding 1 GHz;
- 4. Test equipment as follows:
- 4.a. "Stored program controlled" equipment "specially designed" for testing discrete semiconductor devices and unencapsulated dice, capable of testing at frequencies exceeding 18 GHz;
- 4.b. "Stored program controlled" equipment "specially designed" for testing integrated circuits and "electronic assemblies" thereof, capable of functional testing:
- 4.b.1. At a 'pattern rate' exceeding 20 MHz; or
- 4.b.2. At a 'pattern rate' exceeding 10 MHz but not exceeding 20 MHz and capable of testing packages of more than 68 terminals.
- 4.c. Equipment "specially designed" for determining the performance of focal-plane arrays at wavelengths of more than 1,200 nm, using "stored program controlled" measurements or computer aided evaluation and having any of the following characteristics:
- 4.c.1. Using scanning light spot diameters of less than 0.12 mm;
- 4.c.2. Designed for measuring photosensitive performance parameters and for evaluating frequency response, modulation transfer function, uniformity of responsivity or noise; or
- 4.c.3. Designed for evaluating arrays capable of creating images with more than 32 × 32 line elements;
- 5. Electron beam test systems designed for operation at 3 keV or below, or "laser" beam systems, for non-contactive probing of powered-up semiconductor devices having any of the following:
- 5.a. Stroboscopic capability with either beam blanking or detector strobing;
- 5.b. An electron spectrometer for voltage measurements with a resolution of less than 0.5 V; or
- 5.c. Electrical tests fixtures for performance analysis of integrated circuits;
- 6. "Stored program controlled" multifunctional focused ion beam systems "specially designed" for manufacturing, repairing, physical layout analysis and testing of masks or semiconductor devices and having either of the following characteristics:
- 6.a. Target-to-beam position feedback control precision of 1 micrometer or finer; or
- 6.b. Digital-to-analog conversion accuracy exceeding 12 bit;
- 7. Particle measuring systems employing "lasers" designed for measuring particle size and concentration in air having both of the following characteristics:
- 7.a. Capable of measuring particle sizes of 0.2 micrometer or less at a flow rate of 0.02832 m3 per minute or more; and
- 7.b. Capable of characterizing Class 10 clean air or better.
Control Reasons Explained
This ECCN is controlled for the following reasons. Each reason maps to a column on the Commerce Country Chart, which determines whether a license is required for a given destination.
- ATAnti-Terrorism
- Basic anti-terrorism controls that apply to most items on the CCL. A license is required for exports to countries designated as state sponsors of terrorism.
Common Questions About 3B992
What does ECCN 3B992 cover?
ECCN 3B992 is an entry on the Commerce Control List (Electronics). The List of Items Controlled below describes the products, software, or technology captured by this classification. Compare your item against those parameters when self-classifying.
How do license requirements work for this ECCN?
License need depends on the control reasons shown for this code (for example NS, RS, MT, AT), the destination country, and how your transaction maps against the Commerce Country Chart, de minimis, and other EAR provisions. This page is a research aid only. Confirm against the current rule text and your specific facts before exporting.
Where is the official text for this ECCN?
The legal text appears in Supplement No. 1 to part 774 of the Export Administration Regulations (15 CFR Part 774). Use the official BIS link on this page to open the current supplement entry for this ECCN.
What if my product matches more than one ECCN?
When several ECCNs appear to fit, the controlling entry is usually the one that is most specific to your item's form, function, or technical limits. Cross-references in the List of Items Controlled and related ECCNs listed on this page are common starting points for narrowing the choice.
How often should I re-check this classification?
The Commerce Control List changes when BIS publishes new or amended rules. Revisit the official entry when regulations update, when the product's technical parameters change, or when the destination, end-user, or end-use of a transaction changes.
What do the control reason codes mean?
Each control reason (NS, RS, MT, AT, etc.) maps to a column on the Commerce Country Chart in Supplement No. 1 to part 738 of the EAR. When a control reason applies to your ECCN and the destination country has an X in that column, a license is generally required unless an exception applies. See the Control Reasons Explained section on this page for details on each code.